Octane SDD Series for the TEM

Product Details : 

EDAX's TEAM™ EDS system featuring the Octane Silicon Drift Detector (SDD) Series for the Transmission Electron Microscope (TEM) provides the ultimate analytical solution for TEM applications. The series includes:

• The Octane T Plus: a cost-effective entry-level SDD with a Super Ultra Thin Window (SUTW).
• The Octane T Optima: based on a column-specific design providing a windowless detector with solid angles up to 0.5 sr.
• The Octane T Ultra: the ultimate in analytical TEM performance with solid angles up to 1.1 sr.

EDAX was the first microanalysis company to introduce a windowless SDD. This design provides optimum light element performance with complete transmission of low energy X-rays. When compared to a SUTW detector, the light element sensitivity is improved up to 500% and the count rate is increased by 30% for heavy elements. As a result, the mapping speed and light element detection in low concentrations are greatly enhanced with the windowless design.