Orbis Micro-XRF Analyzers

Product Details : 

• These benchtop instruments can measure elements from Na to Bk in either air or low-vacuum conditions. With the penetrating power of X-rays and larger spot size, Orbis analyzers are more appropriate than scanning electron microscopes for samples with larger-scale features. EDAX’s powerful, easy-to-use Vision software provides precise elemental analysis.

Innovative X-ray Optic/Video Geometry

• Orbis mounts its advanced X-ray optics and high-quality video camera perpendicular to the sample, making the instrument appropriate for a broader range of sample geometries. This innovative design provides true “what you see is what you analyze” capability. Obstruction of the X-ray beam, which leads to erroneous measurements, can easily be detected. If the camera has an obstructed view, then the X-ray beam is obstructed. Shadowing of the X-ray beam is eliminated when measuring samples with topography. In addition, qualitative analysis is more easily performed beyond the designed working distance range of the instrument.

A Wider Range of Applications

• Orbis analyzers are ideal for a variety of applications including criminal forensics, industrial quality control, and non-destructive testing, plus materials, electronics, and geological sample analyses.