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Atomic Force Microscopes:
Tosca 200
- Top-level AFM for entry-level budgets
- Biggest sample stage in price segment (50 mm fully addressable)
- Fastest time-to-measure on the market (only 3 min)
- Scan size of 15 µm in Z and 90 µm x 90 µm in X and Y direction
- Cantilever exchange in less than 10 seconds
- All modes on the same sample spot without head exchange
Tosca 400
- Biggest sample stage in price segment (up to 200 mm for wafers)
- Highest level of hard- and software automation for your AFM
- Fastest time-to-measure on the market (only 3 min)
- Cantilever exchange in less than 10 seconds
- All modes on the same sample spot without head exchange
Top-level AFM for entry-level budgets: with the fastest measurement setup and largest sample stage, the Tosca series will keep up with your AFM nano surface analysis.
Tosca is the first choice for researchers, pioneers, thinkers, and creators in nanotechnology material science.
Mode switching with head exchange was yesterday: Tosca enables measurement on the exact same spot using all available modes combined in one head.
Technical specifications :
| Tosca 400 | Tosca 200 | |
| Scanner | ||
| X-Y scan range | 100 µm x 100 µm | 50 µm x 50 µm* |
| Z scan range | 15 µm | 10 µm** |
| Max. scan speed | 10 lines/s | 5 lines/s |
| Sample | ||
| Max. sample diameter | 100 mm (200 mm***) | 50 mm |
| Max. sample height | 25 mm (2 mm***) | |
| Max. sample weight | <600 g | |
| Position repeatability (uni-directional) | <1 µm | |
| Video microscope | ||
| Camera | Color, 5 megapixel, CMOS sensor | |
| Field of view | 1.73 mm x 1.73 mm | |
| Spatial resolution | 5 µm | |
| Focus | Motorized focus | |
| Overview camera | ||
| Camera | Color, 5 megapixel, CMOS sensor | |
| Field of view | 40 mm x 40 mm | |
| Spatial resolution | 50 µm | |
| Side-view camera | ||
| Side-view camera | Black and white, range of view 30 mm | |
| Modes | ||
| Standard modes | Contact mode, tapping mode (including phase image), lateral force microscopy, force distance curve | |
| Optional modes | Contact resonance amplitude imaging, magnetic force microscopy, Kelvin probe force microscopy, electrostatic force microscopy, conductive atomic force microscopy, current control conductive atomic force microscopy | |
| Dimensions and weight | ||
| Size (D x W x H), AFM unit | 490 mm x 410 mm x 505 mm | |
| Size (D x W x H), controller | 340 mm x 305 mm x 280 mm | |
| Weight, AFM unit | 51.1 kg | |
| Weight, controller | 7.8 kg | |
* optional upgrade to 90 µm x 90 µm
** optional upgrade to 12 µm or 15 µm
*** when using the Wafer Stage (optional)
Atomic Force Microscopes
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Anton Paar India Pvt. Ltd. - Product Code: Tosca-200
- Availability: In Stock
- ₹0
Seller information
Anton Paar India Pvt. Ltd.
- Anton Paar India Pvt. Ltd.
- https://www.anton-paar.com/in-en/products/
- Gurgaon, India
- Business Type :Supplier, Manufacturer
