XJP600 Multifunctional precision measuring microscope is developed and aimed at the semiconductor industry,Silicon wafer manufacuring industry,electronic information industry,metallurgical industry.As an advanced precision measuring microscope,it can be used to identify,analyze and measure structure of a variety of metal,alloy and also for detecting the semiconductor,LCD,TFT,PDP and solar cell panel.
The ergonomics design makes you feel comfortable.
Specification
Eyepiece | Super Wide field Plan eyepiece WF10×/23mm WF10×/20mm,crosshair with reticule0.1mm |
Optical system | infinite optical system |
Viewing Head | Positive Compensation free head inclined at 30° interpupilary distance adjustable( 50mm-75mm) |
Objective | 95mm infinite Plan Apochromatic LWD objectives 5X/0.15(W.D.44mm) 10X/0.30(W.D.44mm) 20X/0.35(W.D.44mm) 50X/0.50(W.D.44mm) |
Nosepiece | Quadruple Nosepiece with DIC jack,adjustable center |
Stage | Stage Size:286mm x 286mm Moving Range:100mm x 100mm Quick X and Y direction moving function |
Focusing | Coaxial coarse & fine focusing adjustment, fine focusing scale value 0.002mm Z direction lifting range:150mm |
Light Source | Surface Lighting,Kohler illumination with aperture iris diaphragm and field iris diaphragm; field iris diaphragm;Halogen Bulb 12V/50W,AC85V-230V,brightness adjustable Contour Lighting Telecentric Lighting,Halogen Bulb 12V/50W,AV85V-230V,brightness adjustable |
Polarizing Device | Analyzer rotatable 360°,porlarizer & analyzer swing out of the light path |
Display Device | Number of Axes:2 or 3 Resolution:0.0005mm Function:Zero set,directional conversion,data output,TTL Signal Power supply:AC85V~230V |