Dips Structure Measurement

Product Details : 

• semi-automatic measurement of semiconductor structures to minimize measurement errors
• threshold method: the user can select the edges to measure by mouse, the software automatically aligns the measurement cursors to the specified threshold between edge minimum and edge maximum
• several lines can be averaged for the measurement
• spline interpolation for noise suppression, enables measurements in sub-pixel range
• line profile for visual control and display of the measured distance in the image
• measured distance can be burned into the image together with a dimensioning label
• measured values can be taken over into a measurement table